Euroscan
Resistivity measurement
Non contact method for the determination of the resistivity of large area (high resistivity) semi-conductor wafers.
The homogeneity of the compound semiconductor wafers of high resistivity determines the production yield, and, therefore, the production cost for industry. Thirty years of experience in the field of growth and characterisation of semi-insulating compound semiconductors have helped us to develop the best suited instruments for both research and industry.
To determine the resistivity of large area semiconductor wafers, a non contact method is mandatory, to avoid any modification of the material afterwards during the contact processing.
> Euroscan PDF

Euro-X-Topo
Characterisation of mono crystals by X-ray diffraction.
Measurement of lattice parameters of oriented mono crystalline sample followed by topography according to Lang method.
The Eurorad's solution for X-ray topography has been designed for crystal sample up to 75mm diameter. It is especially useful for quick and efficient control of crystal suffering from a native low defect creation and subjet tyo mosaïcity. Principaly designed for compound like CdTe, CdZnTe, InSb, PbTe, but can also be used for quick quality control of any kind of crystal.
> Euro-X-Topo PDF

Euro-X-Scan
Full scale semiconductor wafer chemical composition scanner by capillary focused X-ray microbeam.
X-ray fluorescence is a widely used technique for chemical composition analysis. The fluorescence is generally excited through a shielded X-ray beam or an electronic microscopy. The shielding reduces drastically the beam intensity, whereas the electronic microscope needs vacuum operation. Here, no vacuum is necessary and the X-ray beam is no longer reduced in size by shielding but through a computer calculated capillary, as developed in house. In this manner, not only small beam sizes (typically 20 mm in diameter) but also high gains in intensity compared to conventional methods (the gains are between 50 and 100).
The standard version of the instrument is able to measure with a resolution of typically 20 mm the X-ray excited fluorescence lines of the chemicals, without any physical contact on a full scale wafers by scanning. Besides semiconductor wafers, the instrument can be used to analyze with a high local resolution any solid surface.
> Euro-X-Scan PDF

Nuke
Despite a very low size and weight this new radioactivity warning system is very reliable an can be used for various applications.
It can detect all X and gamma rays above 15 keV as well as electrons and betas above 600 keV.
> Nuke PDF

L36
This dosimeter is accurate, reliable, rugged and light weight. Energy range: 20 keV to over 1 MeV. It contains an energy compensated silicon detector ans uses a microprocessor to monitor the radiation rate ans dose level. An LCD display provides indications on the dose and dose rate.
> L36 PDF

Bequerel-meter
This apparatus has been especially developed for an easy measurement of the Gamma-ray activity, both of solids and liquids, especially in food. Using a small material volume, this microprocessor based set-up gives the absolute activity in Bq/L (with a threshold of 25 Bq/L in the error measurements). The ambient radioactivity is automatically substracted from the measured sample's activity.
> Bequerel-meter PDF

Gamma Count 16
This unit is a 16 channels system including shaper amplifier, energy discriminator and high voltage. It's dedicated to photons couting in a settled energy window via software.
Option available : 2PC cards and test software.

EuroWin
System including 1 to 4 channels with shaper amplifier, energy discriminator and high voltage.
> EuroWin PDF

Eurospectrum Enhancer
This spectrometric system allows an enhancement of the spectra obtained with CdTe and CZT detectors at higher energies (i.e. Cs-137). It is specifically adapted to the detectors, probes and preamplifiers developed by Eurorad.
The Euro-Spectrum enhancer includes:
a Time Discriminator (TD-1) allowing an improvement of the resolution as well as the P/V ratio with a minimum loss in the counting rate;
A spectroscopic amplifier with shaping time adjusting;
A fast spectrometric amplifier;
A bias generator (optional) and a power supply allowing full practical efficiency with minimum external connections
> Eurospectrum Enhancer PDF

Charge Pulse Processor
The CPP corrects each pulse coming from a CdTe detector by an amount exactly equivalent to the energy loss by recombination in the crystal. The whole pulse processor comes as a replacement the conventional spectroscopic amplifier.
Main characteristics : Input polarity + /- , Coarse gain 50 to 1000, fine gain x0,5 to x1,5, gated integrator for pulse shaping, separate setting for selection and compensation.
Integral non-linerarity < 0,2%, counting rate uo to 100,000 cps, range from 20 to 1500keV
Can be supplied as NIM module or as a main powered unit.
> CPP NIM PDF
> CPP 110V PDF
> CPP 220V PDF